XPS analysis device Product List and Ranking from 4 Manufacturers, Suppliers and Companies

[Data] Research Institute of Chemical Reaction Mechanisms, Delamination Mechanism of Heterogeneous Material Interfaces 1

We will introduce a case that elucidates the differences in linear expansion coefficients of PET and PEN films with similar main skeletal structures and the mechanisms that produce these differences.

Although they are different materials, if they have similar molecular structures, there is potential for the development and expansion of composite products due to their compatibility and similar properties. However, while they are similar, there are also pitfalls. For example, differences in linear expansion rates can cause strain and displacement at their interface, leading to delamination in many cases. This document presents a case study that clarifies the differences in linear expansion rates between PET and PEN films, which have similar main chain structures, and the mechanisms that produce these differences. [Contents] - About materials PET and PEN - XPS analysis (comparison of bonding states) - TMA analysis (comparison of linear expansion rates) - Data analysis *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Analytical Equipment and Devices

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Interference peak removal process in quantitative analysis

X-ray photoelectron spectroscopy (XPS)

In XPS analysis, in addition to the photoelectron peaks used for evaluation, photoelectron peaks from other orbitals and Auger peaks from X-ray excitation are also detected. Depending on the combination of elements, these sub-peaks can overlap with the target peak and interfere with the evaluation. *Typically, a strong photoelectron peak emitted from an inner shell level close to the outer shell is used. In the quantitative calculations of XPS analysis, the removal of such interfering peaks is primarily performed using the following two methods: 1. Removal using sensitivity coefficient ratios 2. Removal using waveform separation

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] Evaluation of Si Natural Oxidation Film Thickness

Estimation of film thickness using the average free path of photoelectrons.

We will introduce a case where the thickness of extremely thin films, such as natural oxide films on silicon wafers and silicon nitride thin films, which are less than a few nanometers thick, was calculated using XPS analysis. By measuring the Si2p spectrum of the surface of the Si wafer and performing waveform analysis on the obtained spectrum, we can determine the ratio of the presence of each bonding state, and from this result, it is possible to estimate the film thickness based on the average free path of photoelectrons (Equation 1). XPS allows for non-destructive and simple calculation of thin film thickness on substrates as broad average information.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.

The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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[Analysis Case] Atmospheric Non-Exposure XPS Analysis of Lithium-Ion Battery Anodes

This study analyzes cases where the chemical state of the anode surface changed when exposed to the atmosphere compared to when it was not exposed, using an anode extracted from a lithium-ion battery.

【Analysis Sample】 Graphite anode of a commercially available lithium-ion battery used in electronic devices (discharged state) 【Analysis Equipment】 Glove box (purge type, manufactured by Miwa Seisakusho) XPS; monochromatic Al Kα radiation (ULVAC-PHI, PHI5000 VersaProbe II) 【Analysis Procedure】 Inside the glove box (Ar atmosphere), a cylindrical 18650 lithium-ion battery was disassembled to collect the anode. The collected anode was transported from the glove box to the XPS equipment (vacuum) via a transfer vessel, which was designated as the non-atmosphere exposed anode. In contrast, the anode that was temporarily taken out of the glove box (into the atmosphere) before being transported to the XPS equipment was designated as the atmosphere exposed anode, and XPS analysis was conducted on both.

Company：カネカテクノリサーチ本社、東京営業所、名古屋営業所、大阪分析センター、高砂分析センター
Price：Other

Contract measurement

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Evaluation of the oxidation state of titanium oxide (TiOx)

We will also introduce examples of comparative evaluations of various oxidation states of titanium dioxide!

We would like to introduce our evaluation of the oxidation state of titanium oxides (TiOx). In the XPS analysis of titanium oxides, it is possible to investigate the oxidation state from the peak positions, spectral shapes, and satellite positions of the core levels and valence band spectra. In the attached PDF document, we provide examples of comparative evaluations of various oxidation states of titanium oxide, so please take a look. 【Features】 ■ It is possible to investigate the oxidation state from the peak positions, spectral shapes, and satellite positions of the core levels and valence band spectra. *For more details, please download the PDF or feel free to contact us.

Company：東芝ナノアナリシス
Price：Other

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